Download the Presentations from Atomera’s Technology Seminar

Published: February 6, 2020

February 5, 2020

Access the Presentations that Were Shared of MST Smart Profile Breakthrough Revealed

Learn recent technological breakthroughs for significant performance improvement in different semiconductor application areas.. Gain insights from Atomera’s process development experts on using Atomera’s MST technology as a flexible tool to solve many of the challenges faced by today’s semiconductor manufacturers.

Introduction and Welcome
Scott Bibaud, CEO, Atomera

MST® Dopant Engineering and TCAD
Daniel Connelly, Research Scientist, Atomera

MST Smart Profile (SP) Devices for Ron-BV Improvement
Hideki Takeuchi, Director MST Integration, Atomera

MST Breakthrough for RF-SOI
Robert Mears, Chief Technology Officer, Founder, Atomera